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Analyst X™

Software for B-Scanning

Key Features

  • Automated Reporting: Prints the scan plan and B-Scans with a click of a button.
  • Overlay Multiple B-Scans: Compare different scans by overlaying them for detailed analysis.
  • Data Tables: Generate tables showing high, average, and low values for each scan.
  • Re-Gating Function: Re-gate scan data post-collection to create smooth, clean scan maps.
  • Statistical Analysis: Perform automated statistical analysis on scan data.

 


System Features

  • User-Friendly Interface: Easy navigation through setup, analysis, and reporting.
  • Guided Calibration: Assists users through the calibration process.
  • Automated Data Acquisition: Streamlines the scanning process.
  • Adjustable Gain: Modify gain before or during the scan to optimize data return.
  • Real-Time View: Monitor data in real-time and make adjustments during the scan.
  • Repositioning: Pause and resume scans seamlessly, with the ability to reposition the scanner.

 


Reporting

Generating reports is fast and easy with Analyst X™. Automated reporting includes scan plan information and B-Scans associated with the vessel. Create B-Scan overlays for comparison and print charts showing the high, average, and low thickness values of each scan. Data tables and C-Scan views can also be printed for comprehensive reporting.

 


Re-Gating

The re-gating function allows users to clean up data by re-gating selected regions or entire scans to reduce noise interference. Gates are easy to manipulate, adjusted simply by clicking and dragging.

 


Real-Time View

As the scanner maps corrosion, data appears on the screen in real-time. This allows for immediate monitoring and gain adjustments during the scan for optimal results.

 


Analysis

Post-scan, users can add weld lines, flag values, re-gate data, and perform statistical analysis to get the most accurate and detailed results.

 


Adaptability

Analyst X™ is initially configured for use with the X2-X3 Spider System for tank inspections. For dryer roll inspections, the system can be enhanced by adding the D2S add-in to the Analyst X software. This upgrade transitions the system to a Dual-Channel Dryer Scanning System. Additional components, such as a second channel for the X Controller, D2S calibration blocks, D2S wedge, D2S jumper cables, and D2S main cable, are then integrated to complete the D2S system.

 


System Requirements

  • OS: Windows 10/8.1/8/7 (32 and 64-bit)
  • Processor: Any Intel or AMD x86-64 processor
  • RAM: 4 GB (8 GB minimum, 16 recommended)
  • Disk Space: 1 TB
  • Graphics: No specific graphics card required

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ATTACHMENT MODULES

B-SCAN
  • New Mid-Section Body design with high compliance suspension

  • Toolless attachment points and wheel angle adjustment for small radii

  • Probe coupling incorporates our ACR design for reducing turbulence and water consumption

  • Our newest spring design offers the most constant contact force over full travel to date.
C-SCAN
  • C-Scan arms are quick-attached for either front mounted or side
    mounted raster scanning

  • Lead Screw and Belt Drive configurations are both available

  • Lead screw raster module allows toolless Quick-Change of the scan
    arm for differing lengths, utilizing the same raster motor pack

  • New Brushless DC Raster motor design with integrated encoder/
    controller/drive offering high torque and performance in a small assembly
WELD-SCAN
  • Suspension Lock mechanisms for better tracking on axial weld inspection applications

  • Quick Latches provide easy probe spacing and additional height adjustment for the existing high vertical compliance

  • Rigid Tool free probe width adjustment

  • Patented Anti-tip mechanism ensures superior probe contact

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Testimonial

Client Feedback & Reviews

Read what people are saying about ScanTech.

ScanTech Instruments has been an invaluable partner to MFE Inspection Solutions for several years, providing cutting-edge ultrasonic testing scanners that consistently deliver precision and reliability in the most challenging environments. As a leader in non-destructive testing, ScanTech's dedication to innovation and quality aligns seamlessly with MFE's commitment to offering the best inspection solutions on the market. Under the leadership of Alan Dorsey, President of ScanTech, the company has reached new heights in the inspection industry. Alan's extensive background in inspection and his deep understanding of the industry's demands have been instrumental in shaping ScanTech's product offerings to meet the evolving needs of our clients. His commitment to excellence and his hands-on experience in the field ensure that every ScanTech product is engineered with the inspector in mind, providing unmatched reliability and efficiency.

Jason Acerbi CTO, MFE Inspection Solutions Inc.

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